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Proceedings Paper

The new methods for registration and integration of range images
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Paper Abstract

With the improvements in range image acquisition by optical metrology of our group, we also developed a novel method for the registration and integration of range images. The registration approach is based on texture-feature recognition. Texture-feature pairs in two texture images are identified by cross-correlation, and the validity-checking is implemented through Hausdorff distance comparison. The correspondence between the texture image and range image helped acquire the range point-pairs, and the initial transformation of two range images was computed by least-squares technique. With this initial transformation, the fine registration was achieved by ICP algorithm. The integration of the registered range images is based on ray casting. An axis-aligned bounding box for all range images is computed. Three bundles of uniform-distributed rays are cast and pass through the faces of the box along three orthogonal coordinate axes respectively. The intersections between the rays and the range images are computed and stored in Dexels. The KD-tree structure is used to accelerate computation. Those data points in overlapped region are identified with specific criteria based on the distance and the angle of normals. We can obtain a complete non-redundant digital model after removing the overlapped points. The experimental results illustrate the efficiency of the method in reconstructing the whole three dimensional objects.

Paper Details

Date Published: 24 September 2007
PDF: 8 pages
Proc. SPIE 6696, Applications of Digital Image Processing XXX, 66961Y (24 September 2007); doi: 10.1117/12.733658
Show Author Affiliations
Xiaoli Liu, Tianjin Univ. (China)
Shenzhen Univ. (China)
Ameng Li, Shenzhen Univ. (China)
Pengdong Gao, Tianjin Univ. (China)
Shenzhen Univ. (China)
Jindong Tian, Shenzhen Univ. (China)
Xiang Peng, Shenzhen Univ. (China)

Published in SPIE Proceedings Vol. 6696:
Applications of Digital Image Processing XXX
Andrew G. Tescher, Editor(s)

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