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Proceedings Paper

Identification device
Author(s): Jian-Shian Lin; Chih-Chieh Su; Ta-Hsin Chou; Mount-Learn Wu; Chieh-Lung Lai; Che-Lung Hsu; Hsiao-Chin Lan; Hung-I Huang; Yung-Chih Liu; Zong-Ru Tu; Chien-Chieh Lee; Jenq-Yang Chang
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Paper Abstract

In this Letter, the identification device disclosed in the present invention is comprised of: a carrier and a plurality of pseudo-pixels; wherein each of the plural pseudo-pixels is formed on the carrier and is further comprised of at least a light grating composed of a plurality of light grids. In a preferred aspect, each of the plural light grids is formed on the carrier while spacing from each other by an interval ranged between 50nm and 900nm. As the aforesaid identification device can present specific colors and patterns while it is being viewed by naked eye with respect to a specific viewing angle, the identification device is preferred for security and anti-counterfeit applications since the specific colors and patterns will become invisible when it is viewed while deviating from the specific viewing angle.

Paper Details

Date Published: 25 September 2007
PDF: 8 pages
Proc. SPIE 6766, Optoelectronic Devices: Physics, Fabrication, and Application IV, 67660K (25 September 2007); doi: 10.1117/12.733649
Show Author Affiliations
Jian-Shian Lin, Industrial Technology Research Institute (Taiwan)
Chih-Chieh Su, Industrial Technology Research Institute (Taiwan)
Ta-Hsin Chou, Industrial Technology Research Institute (Taiwan)
Mount-Learn Wu, National Central Univ. (Taiwan)
Chieh-Lung Lai, Industrial Technology Research Institute (Taiwan)
Che-Lung Hsu, National Central Univ. (Taiwan)
Hsiao-Chin Lan, National Central Univ. (Taiwan)
Hung-I Huang, National Central Univ. (Taiwan)
Yung-Chih Liu, National Central Univ. (Taiwan)
Zong-Ru Tu, National Central Univ. (Taiwan)
Chien-Chieh Lee, National Central Univ. (Taiwan)
Jenq-Yang Chang, National Central Univ. (Taiwan)

Published in SPIE Proceedings Vol. 6766:
Optoelectronic Devices: Physics, Fabrication, and Application IV
Joachim Piprek; Jian J. Wang, Editor(s)

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