
Proceedings Paper
Mechanical design of a high-resolution x-ray powder diffractometer at the Advanced Photon SourceFormat | Member Price | Non-Member Price |
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Paper Abstract
A novel high-resolution x-ray powder diffractometer has been designed and commissioned at the bending magnet
beamline 11-BM at the Advanced Photon Source (APS), Argonne National Laboratory (ANL). This state-of-the-art
instrument is designed to meet challenging mechanical and optical specifications for producing high-quality powder
diffraction data with high throughput. The 2600 mm (H) X 2100 mm (L) X 1700 mm (W) diffractometer consists of
five subassemblies: a customized two-circle goniometer with a 3-D adjustable supporting base; a twelve-channel high-resolution crystal analyzer system with an array of precision x-ray slits; a manipulator system for a twelve scintillator x-ray detectors; a 4-D sample manipulator with cryo-cooling capability; and a robot-based sample exchange automation system.
The mechanical design of the diffractometer as well as the test results of its positioning performance are presented in
this paper.
Paper Details
Date Published: 26 September 2007
PDF: 8 pages
Proc. SPIE 6665, New Developments in Optomechanics, 66650N (26 September 2007); doi: 10.1117/12.733110
Published in SPIE Proceedings Vol. 6665:
New Developments in Optomechanics
Alson E. Hatheway, Editor(s)
PDF: 8 pages
Proc. SPIE 6665, New Developments in Optomechanics, 66650N (26 September 2007); doi: 10.1117/12.733110
Show Author Affiliations
D. Shu, Argonne National Lab. (United States)
P. L. Lee, Argonne National Lab. (United States)
C. Preissner, Argonne National Lab. (United States)
M. Ramanathan, Argonne National Lab. (United States)
M. Beno, Argonne National Lab. (United States)
R. B. Von Dreele, Argonne National Lab. (United States)
J. Wang, Argonne National Lab. (United States)
P. L. Lee, Argonne National Lab. (United States)
C. Preissner, Argonne National Lab. (United States)
M. Ramanathan, Argonne National Lab. (United States)
M. Beno, Argonne National Lab. (United States)
R. B. Von Dreele, Argonne National Lab. (United States)
J. Wang, Argonne National Lab. (United States)
R. Ranay, Argonne National Lab. (United States)
L. Ribaud, Argonne National Lab. (United States)
C. Kurtz, Argonne National Lab. (United States)
X. Jiao, Argonne National Lab. (United States)
D. Kline, Argonne National Lab. (United States)
P. Jemian, Argonne National Lab. (United States)
B. H. Toby, Argonne National Lab. (United States)
L. Ribaud, Argonne National Lab. (United States)
C. Kurtz, Argonne National Lab. (United States)
X. Jiao, Argonne National Lab. (United States)
D. Kline, Argonne National Lab. (United States)
P. Jemian, Argonne National Lab. (United States)
B. H. Toby, Argonne National Lab. (United States)
Published in SPIE Proceedings Vol. 6665:
New Developments in Optomechanics
Alson E. Hatheway, Editor(s)
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