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Proceedings Paper

Percolation transport in single-walled carbon nanotube films: experiment and simulation
Author(s): Ant Ural; Ashkan Behnam; Jason Johnson; Yongho Choi
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Paper Abstract

We present the scaling of percolation resistivity in nanotube films as a function of nanotube and device parameters both experimentally and using simulations. We first characterize the resistivity of these films down to 200 nm lateral dimensions by fabricating standard four-point-probe structures. We find that the film resistivity starts to increase at device widths below 20 microns, and exhibits an inverse power law dependence on width below a critical width of 2 microns. We then use quasi-3D Monte Carlo simulations to model and fit these experimental results. In addition to fitting the experimental data, we also study the effect of four parameters, namely nanotube density, length, alignment, and measurement direction on resistivity and its scaling with device width. We explain these simulation results by simple physical and geometrical arguments. Nanoscale study of percolation transport mechanisms in nanotube films is essential for understanding and characterizing their performance in nanosensing device applications.

Paper Details

Date Published: 25 September 2007
PDF: 12 pages
Proc. SPIE 6769, Nanosensing: Materials, Devices, and Systems III, 67690B (25 September 2007); doi: 10.1117/12.732878
Show Author Affiliations
Ant Ural, Univ. of Florida (United States)
Ashkan Behnam, Univ. of Florida (United States)
Jason Johnson, Univ. of Florida (United States)
Yongho Choi, Univ. of Florida (United States)

Published in SPIE Proceedings Vol. 6769:
Nanosensing: Materials, Devices, and Systems III
M. Saif Islam; Achyut K. Dutta, Editor(s)

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