
Proceedings Paper
Terahertz wave parametric generation and applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
After more than a dozen years of basic research into the submillimeter and far infrared range, terahertz (THz) wave
research has finally come into its own, and is recognized by the world scientific community as a new frontier. While
femtosecond laser pumped THz wave sources have opened up a new vista in applied research, the ideal THz wave source
will likely require high coherence and wide tunability. When this level of quality is finally made available in a userfriendly
device, there is little doubt that applied research efforts into the THz region will enjoy a true renaissance. In this
direction we have developed a widely tunable injection seeded THz-wave parametric generator (is-TPG) that operates at
room temperature. The spectral resolution is the Fourier transform limit of the nanosecond THz wave pulses. In our
laboratory, THz-waves continue to broaden their range of applications as following. We have developed a basic
technology for THz imaging which allows detection and identification of drugs concealed in envelopes by introducing
the component spatial pattern analysis. On the other hand, for inspecting electrical failures in large scale integration
circuit, we developed the laser-THz emission microscope, which records the map of THz emission amplitude in a sample
upon excitation with fs laser pulses.
Paper Details
Date Published: 12 October 2007
PDF: 5 pages
Proc. SPIE 6772, Terahertz Physics, Devices, and Systems II, 677202 (12 October 2007); doi: 10.1117/12.731745
Published in SPIE Proceedings Vol. 6772:
Terahertz Physics, Devices, and Systems II
Mehdi Anwar; Anthony J. DeMaria; Michael S. Shur, Editor(s)
PDF: 5 pages
Proc. SPIE 6772, Terahertz Physics, Devices, and Systems II, 677202 (12 October 2007); doi: 10.1117/12.731745
Show Author Affiliations
Shin'ichiro Hayashi, RIKEN (Japan)
Published in SPIE Proceedings Vol. 6772:
Terahertz Physics, Devices, and Systems II
Mehdi Anwar; Anthony J. DeMaria; Michael S. Shur, Editor(s)
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