
Proceedings Paper
Preliminary design and noise considerations for an ultrasensitive magnetic field sensorFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, we discuss the structural design including the materials, junction areas, and magnetic layers thicknesses,
and various noise sources including Johnson noise, shot noise, 1/f noise, and thermal magnetic noise, that must be
considered when building a magnetic tunnel junction (MTJ) magnetic field sensor with the goal of SQUID-like
sensitivity. Analytical derivations of the sensor sensitivity and different noise sources are provided. A highly-portable
software design tool is developed to optimize the various parameters of the sensor design, while also predicting the
expected sensitivity, operating frequency range, operating current and power of the finished sensor. The functions and
operations of this design tool are described. The relationships between the sensor detectivity and some critical design
parameters are studied with this design tool. A possible design for the construction of an ultrasensitive magnetic field
sensor is proposed.
Paper Details
Date Published: 11 September 2007
PDF: 12 pages
Proc. SPIE 6645, Nanoengineering: Fabrication, Properties, Optics, and Devices IV, 66450T (11 September 2007); doi: 10.1117/12.731142
Published in SPIE Proceedings Vol. 6645:
Nanoengineering: Fabrication, Properties, Optics, and Devices IV
Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)
PDF: 12 pages
Proc. SPIE 6645, Nanoengineering: Fabrication, Properties, Optics, and Devices IV, 66450T (11 September 2007); doi: 10.1117/12.731142
Show Author Affiliations
Philip W. T. Pong, National Institute of Standards and Technology (United States)
Robert McMichael, National Institute of Standards and Technology (United States)
Alan S Edelstein, Army Research Lab. (United States)
Robert McMichael, National Institute of Standards and Technology (United States)
Alan S Edelstein, Army Research Lab. (United States)
Edmund R Nowak, Univ. of Delaware (United States)
William F. Egelhoff Jr., National Institute of Standards and Technology (United States)
William F. Egelhoff Jr., National Institute of Standards and Technology (United States)
Published in SPIE Proceedings Vol. 6645:
Nanoengineering: Fabrication, Properties, Optics, and Devices IV
Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)
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