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Proceedings Paper

Method of optical axis determination in crystals by use of light depolarization measurements
Author(s): Andrzej W. Domanski; Daniel Budaszewski; Pawel Poziemski; Tomasz R. Wolinski
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Paper Abstract

The paper presents a new method of optical axis determination in uniaxial crystals by use of light depolarization measurements. Partially temporary coherent light may be depolarized during propagation through birefringent media. Degree of polarization fading depends on coherency of light, birefringence of the medium as well as direction of the optical axis of the medium. Hence a light beam passing through the crystal for three perpendicular directions may change degree of polarization in different way and it allows to calculate azimuth of the optical axis. In the test experiments we applied a laser diode lasing at 670 nm and a cube made with lithium niobate (&Dgr;n= 0.086, 1=5mm) as a tested crystal. Degree of polarization of light outgoing from the crystal was measured by use of high quality Glann-Thomson polarizer and a quarter wave plate. The optical axis orientation determined in the crystal was in good agreement with axis azimuth found by use a standard microscopic method.

Paper Details

Date Published: 18 June 2007
PDF: 6 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161V (18 June 2007); doi: 10.1117/12.729634
Show Author Affiliations
Andrzej W. Domanski, Warsaw Univ. of Technology (Poland)
Daniel Budaszewski, Warsaw Univ. of Technology (Poland)
Pawel Poziemski, Warsaw Univ. of Technology (Poland)
Tomasz R. Wolinski, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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