Proceedings Paper
Qualitative characterization of YBa2Cu3O7-δ films using low spectral resolution Raman spectroscopy| Format | Member Price | Non-Member Price |
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Paper Abstract
We describe our low spectral resolution Raman system that allows us to directly appreciate the quality of YBa2Cu3O7-δ
(YBCO) films, obtained by pulsed laser deposition on LaAlO3 substrate. We identify the basic features of YBCO films'
spectral fingerprints, validated by high spectral resolution analysis, described in previous reports. This fast and nondestructive
valuable analytical tool functions at a convenient time and environment after deposition.
Paper Details
Date Published: 25 April 2007
PDF: 5 pages
Proc. SPIE 6606, Advanced Laser Technologies 2006, 660618 (25 April 2007); doi: 10.1117/12.729507
Published in SPIE Proceedings Vol. 6606:
Advanced Laser Technologies 2006
Dan C. Dumitras; Maria Dinescu; Vitally I. Konov, Editor(s)
PDF: 5 pages
Proc. SPIE 6606, Advanced Laser Technologies 2006, 660618 (25 April 2007); doi: 10.1117/12.729507
Show Author Affiliations
M. Branescu, National Institute of Materials Physics (Romania)
I. Morjan, National Institute for Laser, Plasma and Radiation Physics (Romania)
I. Morjan, National Institute for Laser, Plasma and Radiation Physics (Romania)
F. Dumitrache, National Institute for Laser, Plasma and Radiation Physics (Romania)
I. Sandu, National Institute for Laser, Plasma and Radiation Physics (Romania)
I. Sandu, National Institute for Laser, Plasma and Radiation Physics (Romania)
Published in SPIE Proceedings Vol. 6606:
Advanced Laser Technologies 2006
Dan C. Dumitras; Maria Dinescu; Vitally I. Konov, Editor(s)
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