
Proceedings Paper
An improvement on the 4f coherent imaging system for measuring the nonlinear refractionFormat | Member Price | Non-Member Price |
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Paper Abstract
We present a new experiment system to improve the original 4f coherent imaging system developed by Georges Boudebs
et al. In the new experiment system we take off the monitor branch, add another 4f system before the main 4f system and
place one more CCD camera after the first 4f system. Our new experiment system has five advantages: firstly, the old
system needs three steps to measure the nonlinear refraction index of the nonlinear sample, however the new system only
needs two steps. Secondly, in the developed system the CCD camera after the first 4f system can monitor the energy
fluctuation as well as the intensity distribution of the input laser pulse, while the original system can only monitor the
energy fluctuation. Thirdly, the new system realizes the real single-pulse measurement, and can avoid the energy
instability completely. Fourthly, in the new system we can detach the diaphragm and the phase object, so they can adjust
separately. Lastly, the added 4f system can be used as a spatial filter. The shortcomings of our improved system are that
the experiment system becomes a little more complex and the additional CCD camera adds the experiment expenditure.
Paper Details
Date Published: 5 March 2007
PDF: 8 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65950L (5 March 2007); doi: 10.1117/12.726602
Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)
PDF: 8 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65950L (5 March 2007); doi: 10.1117/12.726602
Show Author Affiliations
Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)
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