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Proceedings Paper

The noise and digital realization of arctangent approach of PGC demodulation for optic interferometric sensors
Author(s): Fukun Liao; Min Zhang; Liwei Wang; Yanbiao Liao
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Paper Abstract

While the development of the optic interferometric sensors achieves great progress, one fact that restricts this development is the demodulation technique. An applicable demodulation method for interferometric sensors is called "The Phase Generated Carrier (PGC) demodulation". Yet this demodulation fails to content the large-scale sensors application for the limitations of the electronic devices. Another arctangent approach based on digital demodulator proves more advantages than the traditional Differentiate and Cross Multiply (DCM) approach which is used in PGC demodulation. In this paper, the arctangent approach based on PGC demodulation is discussed and simulated. Lookup table is used in the arctangent approach. Values equal to the existent data in the lookup table are chosen from the table, and values between two different data in the table are modulated to the linear approximate values. Two primary objects are aimed to demonstrate the advantages of the arctangent approach: (1). the noise analysis of this demodulation, considered two aspects: a. the relativity of the noise amplitude and the size of lookup table. Simulation result indicates that when double the lookup size, the noise amplitude decreases about 6dB; b. the influence to the noise generation which is leaded in by the rank of the polynomial approximate coefficients, the higher this rank is, the better the result comes. An approximate function is proposed about this relationship. (2). the measurement range, operation complexity, quality of operation, and applicability of the arctangent approach are discussed for an effective digital realization.

Paper Details

Date Published: 5 March 2007
PDF: 12 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65954A (5 March 2007); doi: 10.1117/12.726512
Show Author Affiliations
Fukun Liao, Tsinghua Univ. (China)
Min Zhang, Tsinghua Univ. (China)
Liwei Wang, Tsinghua Univ. (China)
Yanbiao Liao, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)

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