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Proceedings Paper

In situ monitoring of periodic domain formation in ferroelectric crystals
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Paper Abstract

Ferroelectric crystals, such as lithium niobate (LN) and lithium tantalate, find many photonic applications including the fabrication of periodically poled crystals for nonlinear frequency generation by quasi-phase-matching (QPM). All of the phenomena used in those devices depend on the existence and kinetics of the domain structure. As a consequence, the ability to micro-engineer ferroelectric domains is central to all of these applications and thus techniques for visualizing domain structure and dynamics are important. Recently a digital holography (DH) based technique has been proposed by the authors to visualize the free evolution of reversing domains in ferroelectric substrates during electric field poling. A fundamental step forward has been achieved in this work, where the technique has been applied to resist patterned samples under different voltage waveforms and resist conditions in order to characterize the dynamics of the periodic poling in presence of a resist grating. The results show that this technique can be used as a valid and reliable alternative tool to monitor online the periodic poling of ferroelectric crystals by a non-invasive in-situ procedure, avoiding both the critical control of the poling current and the post-poling etching process. The imaging of the resist grating and of the reversed domain regions can be discriminated accurately by using the qualitative and quantitative information provided by the amplitude and phase shift images, respectively. Moreover the technique allows to investigate systematically and, most important, in-situ the influence of different features on the poling behaviour, such as the poling waveform, the resist grating geometry, the patterned z face, the resist properties. The movies of the periodic poling dynamics are presented and discussed.

Paper Details

Date Published: 18 June 2007
PDF: 8 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160S (18 June 2007); doi: 10.1117/12.726175
Show Author Affiliations
Simonetta Grilli, Istituto Nazionale di Ottica Applicata del CNR (Italy)
Melania Paturzo, Istituto Nazionale di Ottica Applicata del CNR (Italy)
Lisa Miccio, Istituto Nazionale di Ottica Applicata del CNR (Italy)
Pietro Ferraro, Istituto Nazionale di Ottica Applicata del CNR (Italy)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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