Share Email Print

Proceedings Paper

A novel algorithm to stitch adjacent cloud of points of long cylindrical surfaces
Author(s): M. R. Viotti; A. Albertazzi; A. Dal Pont; A. V. Fantin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents an algorithm based on Least Absolute Method to align and stitch multiple adjacent cylindrical clouds of points measured by white light interferometry using conical mirrors. The evaluation of the aligning and stitching algorithm was initially performed by using several numerically simulated clouds of points (COP) of cylindrical surfaces with small shape errors and quite rough surfaces. In order to evaluate the algorithm, each numerically generated COP was split into two parts but always keeping an overlapping area. Numerical translations and rotations were applied in one part to simulate real misalignments. After this, the algorithm was applied to align each adjacent COP pair and to obtain a stitched COP, and the result was compared with the original one. In this way, the performance of the presented algorithm was evaluated and analyzed for several overlapped areas. Excellent results were obtained with an overlapping area of 25% of the total measured length. The differences between the stitched and original cloud of points were always far below the roughness level of the measured surface. A brief description of a modified white light interferometer to measure in cylindrical coordinates as well as early applications of the algorithm in real measurements is also presented.

Paper Details

Date Published: 18 June 2007
PDF: 8 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161E (18 June 2007); doi: 10.1117/12.726166
Show Author Affiliations
M. R. Viotti, Univ. Federal de Santa Catarina (Brazil)
A. Albertazzi, Univ. Federal de Santa Catarina (Brazil)
A. Dal Pont, Photonical Instruments for Technical Applications (Brazil)
A. V. Fantin, Univ. Federal de Santa Catarina (Brazil)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?