
Proceedings Paper
The strain measurement and analysis of fluorescence fiberFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Fluorescence fiber sensors are broadly used to measure temperature, concentration, and pH value etc.
The fluorescence sensing systems are based on different principles, namely fluorescence intensity,
fluorescence intensity ratio, and fluorescence lifetime. The fluorescence lifetime is an effective
parameter for sensing purpose, because it is independent on the intensity of the pumping source and
does not need expensive narrow-band filter. An experiment system has been established. Some samples
are produced to measured the fluorescence lifetime of temperature characteristic and get the
relationship of strain and temperature versus the fluorescence lifetime at the same time. The experiment
result was fitted and analyzed. The test results show that the fluorescence lifetime decreased with the
increasing of temperature. The change of fluorescence lifetime with the strain is inconspicuous
comparing to that with the temperature.
Paper Details
Date Published: 5 March 2007
PDF: 6 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65952R (5 March 2007); doi: 10.1117/12.725902
Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)
PDF: 6 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65952R (5 March 2007); doi: 10.1117/12.725902
Show Author Affiliations
Haili Jiang, Harbin Engineering Univ. (China)
Weimin Sun, Harbin Engineering Univ. (China)
Cong Zhang, Harbin Engineering Univ. (China)
Weimin Sun, Harbin Engineering Univ. (China)
Cong Zhang, Harbin Engineering Univ. (China)
Zhihai Liu, Harbin Engineering Univ. (China)
Fuqiang Jiang, Harbin Engineering Univ. (China)
Yang Zhang, Harbin Engineering Univ. (China)
Fuqiang Jiang, Harbin Engineering Univ. (China)
Yang Zhang, Harbin Engineering Univ. (China)
Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)
© SPIE. Terms of Use
