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Proceedings Paper

Experiment and analysis based on polarization optical time domain reflectometry (POTDR)
Author(s): Zhengyong Li; Chongqing Wu; Yanfei Liu; Mu Cheng; Yongjun Wang; Changyong Tian
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Paper Abstract

New polarization properties have been observed from the Fresnel reflection on the waveforms of OTDR with the commercial OTDR produced by Anritsu company. Then a better POTDR system was established in order to discover the accurate properties, and more remarkable result was obtained by the Serial Data Analyser(SDA5000A).

Paper Details

Date Published: 5 March 2007
PDF: 4 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659539 (5 March 2007); doi: 10.1117/12.725895
Show Author Affiliations
Zhengyong Li, Beijing Jiaotong Univ. (China)
Chongqing Wu, Beijing Jiaotong Univ. (China)
Yanfei Liu, Beijing Jiaotong Univ. (China)
Mu Cheng, Beijing Jiaotong Univ. (China)
Yongjun Wang, Beijing Jiaotong Univ. (China)
Changyong Tian, Beijing Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)

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