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Proceedings Paper

Evaluation and testing of semiconductor laser reliability in optic system
Author(s): Wenyan Tang; Xianguang Fan; Heyi Sun
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Paper Abstract

In order to improve the performance of an optic system, a new evaluation and testing methodology for the light source which uses semiconductor laser is presented. A new system, combining high accuracy source and measure capabilities for pulsed testing, is developed to achieve the aim of automatic measurement of Light-Current-Power (LIV) for semiconductor laser. The test can provide customer with L-I, V-I curves and other correlative parameters, such as the threshold current and slope efficiency, and so on. Meanwhile, the change of environment temperature versus lasing wavelength under pulse injection is discussed, and the relationship between the lasing wavelength and the width and cycle of injection pulse is obtained. The temperature character of packaged laser unit is measured conveniently. Making use of the above examined curves and parameters, the reliability of semiconductor laser and quality of device can be compared directly and evaluated accurately. The technique is successfully applied for the evaluation of semiconductor laser reliability.

Paper Details

Date Published: 5 March 2007
PDF: 6 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659505 (5 March 2007); doi: 10.1117/12.725682
Show Author Affiliations
Wenyan Tang, Harbin Institute of Technology (China)
Xianguang Fan, Harbin Institute of Technology (China)
Heyi Sun, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)

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