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Proceedings Paper

Optical characteristics of monocrystal silicon: current status of measurements
Author(s): S. N. Skovorodko; V. Ya. Mendeleev; A. V. Kourilovich
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Paper Abstract

Methods and apparatuses for measuring optical constants and measured optical constants of silicon presented in literature published in time interval of about 50 year are described. It is found the relative difference for refraction index measured by different authors is about 10%. For absorption index, measured values differ from each other by about one order. Reasons for the found disagreement between experimental results are analyzed.

Paper Details

Date Published: 11 January 2007
PDF: 9 pages
Proc. SPIE 6594, Lasers for Measurements and Information Transfer 2006, 65940J (11 January 2007); doi: 10.1117/12.725600
Show Author Affiliations
S. N. Skovorodko, Institute for High Temperatures (Russia)
V. Ya. Mendeleev, Institute for High Temperatures (Russia)
A. V. Kourilovich, Institute for High Temperatures (Russia)

Published in SPIE Proceedings Vol. 6594:
Lasers for Measurements and Information Transfer 2006
Vadim E. Privalov, Editor(s)

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