
Proceedings Paper
Observation and research of chip formation and efflux by high speed hard cuttingFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
This paper observed the chip forming and effusing process when high speed hard turning hardened steel using PCBN
tools under two-dimensional longitudinal turning and transverse turning by high-speed photography, and obtained the
chip formation and efflux states with different cutting edge preparation and parameters. The experiment results showed
that the sharp-edged tool was useful for chip forming, but strength of its edge is low and the tool life is short, and that the
tool has longer life under the chamfered edge, but too small or too large cutting thickness goes against the chip forming
and effusing.
Paper Details
Date Published: 29 January 2007
PDF: 5 pages
Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794M (29 January 2007); doi: 10.1117/12.725427
Published in SPIE Proceedings Vol. 6279:
27th International Congress on High-Speed Photography and Photonics
Xun Hou; Wei Zhao; Baoli Yao, Editor(s)
PDF: 5 pages
Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794M (29 January 2007); doi: 10.1117/12.725427
Show Author Affiliations
Xianli Liu, Harbin Univ. of Science and Technology (China)
Fugang Yan, Harbin Univ. of Science and Technology (China)
Yu Wang, Harbin Univ. of Science and Technology (China)
Fugang Yan, Harbin Univ. of Science and Technology (China)
Yu Wang, Harbin Univ. of Science and Technology (China)
Yiwen Wang, Harbin Univ. of Science and Technology (China)
Hongmin Pen, Harbin Univ. of Science and Technology (China)
Tao Chen, Harbin Univ. of Science and Technology (China)
Hongmin Pen, Harbin Univ. of Science and Technology (China)
Tao Chen, Harbin Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 6279:
27th International Congress on High-Speed Photography and Photonics
Xun Hou; Wei Zhao; Baoli Yao, Editor(s)
© SPIE. Terms of Use
