
Proceedings Paper
Analysis of measurement uncertainty in THz-TDSFormat | Member Price | Non-Member Price |
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Paper Abstract
Measurement precision is often required in the process of material parameter extraction. This fact is applicable
to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of
material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical,
optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these
parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall
uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes
the sources of uncertainty and models error propagation through the process.
Paper Details
Date Published: 12 June 2007
PDF: 18 pages
Proc. SPIE 6593, Photonic Materials, Devices, and Applications II, 659326 (12 June 2007); doi: 10.1117/12.721876
Published in SPIE Proceedings Vol. 6593:
Photonic Materials, Devices, and Applications II
Ali Serpengüzel; Gonçal Badenes; Giancarlo C. Righini, Editor(s)
PDF: 18 pages
Proc. SPIE 6593, Photonic Materials, Devices, and Applications II, 659326 (12 June 2007); doi: 10.1117/12.721876
Show Author Affiliations
W. Withayachumnankul, The Univ. of Adelaide (Australia)
H. Lin, The Univ. of Adelaide (Australia)
S. P. Mickan, The Univ. of Adelaide (Australia)
H. Lin, The Univ. of Adelaide (Australia)
S. P. Mickan, The Univ. of Adelaide (Australia)
Published in SPIE Proceedings Vol. 6593:
Photonic Materials, Devices, and Applications II
Ali Serpengüzel; Gonçal Badenes; Giancarlo C. Righini, Editor(s)
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