
Proceedings Paper
Processing misregistered hyperspectral dataFormat | Member Price | Non-Member Price |
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Paper Abstract
Many hyperspectral sensors collect data using multiple spectrometers to span a broad spectral range. These
spectrometers can be fed by optical fibers on the same or separate focal planes. The Modular Imaging Spectrometer
Instrument (MISI), a 70 band line scanner built by the Rochester Institute of Technology, is configured
in this manner. Visible and near infrared spectrometers at the primary focal plane are each fed by their own
optical fiber. The spatial offset between the two fibers on the focal plane causes an inherent misregistration
between the two sets of spectral bands. This configuration causes a relatively complicated misregistration which
cannot be corrected with a simple shift or rotation of the data. This mismatch between spectral channels has
detrimental effects on the spectral purity of each pixel, especially when dealing with the application of sub-pixel
target detection. A geometric model of the sensor has been developed to solve for the misregistration and achieve
image rectification. This paper addresses the issues in dealing with the misregistration and techniques used to
improve spectral purity on a per pixel basis.
Paper Details
Date Published: 7 May 2007
PDF: 10 pages
Proc. SPIE 6565, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XIII, 65651D (7 May 2007); doi: 10.1117/12.720123
Published in SPIE Proceedings Vol. 6565:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XIII
Sylvia S. Shen; Paul E. Lewis, Editor(s)
PDF: 10 pages
Proc. SPIE 6565, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XIII, 65651D (7 May 2007); doi: 10.1117/12.720123
Show Author Affiliations
Jason T. Casey, Rochester Institute of Technology (United States)
Stephen R Lach, U.S. Air Force (United States)
Rochester Institute of Technology (United States)
Stephen R Lach, U.S. Air Force (United States)
Rochester Institute of Technology (United States)
John P. Kerekes, Rochester Institute of Technology (United States)
Published in SPIE Proceedings Vol. 6565:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XIII
Sylvia S. Shen; Paul E. Lewis, Editor(s)
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