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Proceedings Paper

Application of nondestructive optical techniques in the detection of surface and subsurface defects in sapphire
Author(s): Ikerionwu A. Akwani; Douglas L. Hibbard; Keith T Jacoby
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Paper Abstract

Advancements in optical manufacturing and testing technologies for sapphire material are required to support the increasing use of large aperture sapphire panels as windscreens for various electro-optical system applications. It is well known that the grinding and polishing operations employed to create optical surfaces leads to the introduction of surface stress and sub-surface damage which can affect critical opto-mechanical performance characteristics such as strength and durability. Traditional methods for measuring these defects are destructive and, therefore, unsuitable as in-process, high volume inspection tools. A number of non-destructive optical techniques were investigated at Exotic Electro-Optics under funding by the Office of Naval Research and the Air Force Research Laboratory including Raman spectroscopy, laser polarimetry and the Twyman effect to characterize process-induced defects in sapphire panels. Preliminary experimental results using these techniques have shown that surface stress and sub-surface damage may be non-destructively measured. Raman spectroscopy has shown promise in quantifying surface stress, laser polarimetry is of questionable utility and the Twyman effect may be used qualitatively to monitor relative stress and sub-surface damage. This information will ultimately provide a better understanding of the overall manufacturing process leading to optimized process time and cost.

Paper Details

Date Published: 2 May 2007
PDF: 12 pages
Proc. SPIE 6545, Window and Dome Technologies and Materials X, 65450J (2 May 2007); doi: 10.1117/12.720120
Show Author Affiliations
Ikerionwu A. Akwani, Exotic Electro-Optics (United States)
Douglas L. Hibbard, Exotic Electro-Optics (United States)
Keith T Jacoby, Exotic Electro-Optics (United States)

Published in SPIE Proceedings Vol. 6545:
Window and Dome Technologies and Materials X
Randal W. Tustison, Editor(s)

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