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Proceedings Paper

Magnetorheological Finishing of freeform optics
Author(s): Christopher Hall; Andrew Jones; Bill Messner; Bob Hallock
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Paper Abstract

New optical designs containing freeform optics have recently begun appearing in systems. Applications have incorporated parts ranging in size from small (e.g.: ~5 – 10 mm rectangles) to large (e.g.: astronomical applications). To meet these needs, QED Technologies recently introduced two solutions using its Q22-Y and Q22-950F platforms. Magnetorheological Finishing® (MRF®) is a production proven technology for deterministically finishing symmetric parts (flats, spheres, and on-axis aspheres) using a rotational toolpath, and rectangular flats and cylinders using a raster toolpath. The new freeform toolpath expands the raster capabilities of the Q22-Y and Q22-950F machines to include spheres, aspheres, off-axis sections, and true freeform geometries. The freeform raster toolpath was first introduced on a meter-class optic platform, the Q22-950F. As optics grow in size, the mass typically scales as well. This in turn increases the demands on the machine dynamics to meet rotational polishing requirements. The raster freeform toolpath solution greatly reduces the machine dynamics and is employed to polish a wide variety of part shapes, sizes, and geometries. A similar version of the toolpath was subsequently implemented on the smaller Q22-Y platform. This paper will compare the implementations on each platform, describe the benefits of the toolpath for existing and new applications, and present results from demonstrations on the two platforms.

Paper Details

Date Published: 14 May 2007
PDF: 4 pages
Proc. SPIE 10316, Optifab 2007: Technical Digest, 103160J (14 May 2007); doi: 10.1117/12.719886
Show Author Affiliations
Christopher Hall, QED Technologies (United States)
Andrew Jones, QED Technologies (United States)
Bill Messner, QED Technologies (United States)
Bob Hallock, QED Technologies (United States)

Published in SPIE Proceedings Vol. 10316:
Optifab 2007: Technical Digest
James J. Kumler; Matthias Pfaff, Editor(s)

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