
Proceedings Paper
Examining explosive residues on surfaces with terahertz technologyFormat | Member Price | Non-Member Price |
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Paper Abstract
It is well-known that many explosives have characteristic terahertz (THz) absorption features, and that THz waves can
penetrate many dielectric materials. However security applications generally prohibit using THz technology for
transmission measurements, either because of standoff distances, thick targets, or opaque targets (metals). As a result,
we focus our attention on THz reflection spectroscopy. We have measured the THz reflectivity signature of RDX
residues on smooth metal surfaces that contain about 0.4 mg of RDX. We discuss our efforts in detecting trace
explosives in reflection as well as our recent results including THz spectroscopy of four explosives from 1 to 6 THz,
and measurement of the absolute absorption cross-section of explosives.
Paper Details
Date Published: 4 May 2007
PDF: 7 pages
Proc. SPIE 6549, Terahertz for Military and Security Applications V, 65490I (4 May 2007); doi: 10.1117/12.719816
Published in SPIE Proceedings Vol. 6549:
Terahertz for Military and Security Applications V
James O. Jensen; Hong-Liang Cui, Editor(s)
PDF: 7 pages
Proc. SPIE 6549, Terahertz for Military and Security Applications V, 65490I (4 May 2007); doi: 10.1117/12.719816
Show Author Affiliations
Yamac Dikmelik, Johns Hopkins Univ. (United States)
Michael J. Fitch, Johns Hopkins Univ. Applied Physics Lab. (United States)
Michael J. Fitch, Johns Hopkins Univ. Applied Physics Lab. (United States)
Megan R. Leahy-Hoppa, Johns Hopkins Univ. Applied Physics Lab. (United States)
Robert Osiander, Johns Hopkins Univ. Applied Physics Lab. (United States)
Robert Osiander, Johns Hopkins Univ. Applied Physics Lab. (United States)
Published in SPIE Proceedings Vol. 6549:
Terahertz for Military and Security Applications V
James O. Jensen; Hong-Liang Cui, Editor(s)
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