Proceedings Paper
Finesse of silicon-based terahertz Fabry-Perot spectrometer| Format | Member Price | Non-Member Price |
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Paper Abstract
This paper considers factors that affect achievable finesse for a recently demonstrated silicon-based scanning Fabry-
Perot transmission filter at millimeter and sub-millimeter wavelengths. The mirrors are formed by alternating quarter-wave
optical thicknesses of silicon and air in the usual Bragg configuration. Fundamental loss by lattice and free carrier
absorption are considered. Technological factors such as surface roughness, bowing, and misalignment are considered
for various proposed manufacturing schemes.
Paper Details
Date Published: 4 May 2007
PDF: 7 pages
Proc. SPIE 6549, Terahertz for Military and Security Applications V, 65490R (4 May 2007); doi: 10.1117/12.719577
Published in SPIE Proceedings Vol. 6549:
Terahertz for Military and Security Applications V
James O. Jensen; Hong-Liang Cui, Editor(s)
PDF: 7 pages
Proc. SPIE 6549, Terahertz for Military and Security Applications V, 65490R (4 May 2007); doi: 10.1117/12.719577
Show Author Affiliations
Justin W. Cleary, Univ. of Central Florida (United States)
Robert E. Peale, Univ. of Central Florida (United States)
Ravi Todi, Univ. of Central Florida (United States)
Robert E. Peale, Univ. of Central Florida (United States)
Ravi Todi, Univ. of Central Florida (United States)
Kalpathy Sundaram, Univ. of Central Florida (United States)
Oliver Edwards, Zyberwear Inc. (United States)
Oliver Edwards, Zyberwear Inc. (United States)
Published in SPIE Proceedings Vol. 6549:
Terahertz for Military and Security Applications V
James O. Jensen; Hong-Liang Cui, Editor(s)
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