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Proceedings Paper

MRDF and BRDF measurements of low-scatter materials
Author(s): Thomas J. Papetti; William E. Walker; Charles E. Keffer; Billy E. Johnson
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Paper Abstract

Bidirectional reflectivity distribution function (BRDF) measurement results are reported for the monostatic case and for small bistatic angles for several low-scatter diffuse materials illuminated at the 1.064 &mgr;m and 532 nm wavelengths. Materials such as ESLI Vel-Black, Edmund Scientific flocked paper, and 2% Spectralon were measured. All materials were measured using both co-polarized and cross-polarized transmit-receive configurations. The MRDF/BRDF scatterometer at the Advanced Measurements Optical Range (AMOR) at Redstone Arsenal in Huntsville, Alabama was used for these measurements and is described here; this beamsplitter-based system can make BRDF measurements with incidence angles from 0 to 80° and with in-plane and out-of-plane bistatic angles from + 3.5° through -3.5°, including the monostatic point.

Paper Details

Date Published: 4 May 2007
PDF: 12 pages
Proc. SPIE 6550, Laser Radar Technology and Applications XII, 65500H (4 May 2007); doi: 10.1117/12.718662
Show Author Affiliations
Thomas J. Papetti, EDO-CAS, Inc. (United States)
William E. Walker, EDO-CAS, Inc. (United States)
Charles E. Keffer, EDO-CAS, Inc. (United States)
Billy E. Johnson, U.S. Army Space and Missile Defense Command (United States)


Published in SPIE Proceedings Vol. 6550:
Laser Radar Technology and Applications XII
Monte D. Turner; Gary W. Kamerman, Editor(s)

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