
Proceedings Paper
Research of the new optical diffractive super-resolution element of the two-photon microfabricationFormat | Member Price | Non-Member Price |
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Paper Abstract
The new optical diffractive superresolution element (DSE) is being applied to improve the microfabrication radial
superresolution in the two-photon three-dimension (3D) microfabrication system, which appeared only a few years ago
and can provide the ability to confine photochemical and physical reactions to the order of laser wavelength in three
dimensions. The design method of the DSE is that minimizing M if the lowest limit Sl of the S and the highest limit Gu of
the G is set, where Liu [1] explained the definition of the S, M and G. Simulation test result proved that the
microfabrication radial superresolution can be improved by the new optical DSE. The phenomenon can only be
interpreted as the intensity of high-order and side of the zero-order diffraction peaks have been clapped under the twophoton
absorption (TPA) polymerization threshold. In a word the polymerized volume can be chosen because the Sl and
the Gu is correspondingly adjustable, even if the laser wavelength, objective lens and the photosensitive resin is fixed for
a given two-photon microfabrication system. That means the radial superresolution of the two-photon microfabrication
can be chosen.
Paper Details
Date Published: 6 November 2006
PDF: 7 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635743 (6 November 2006); doi: 10.1117/12.717280
Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635743 (6 November 2006); doi: 10.1117/12.717280
Show Author Affiliations
Peng Wei, Tsinghua Univ. (China)
Yu Zhu, Tsinghua Univ. (China)
Yu Zhu, Tsinghua Univ. (China)
Guanghong Duan, Tsinghua Univ. (China)
Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)
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