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Proceedings Paper

A measuring system for surface roughness parameters
Author(s): Jinhong Han; Yunkai Wang; Xianfeng Zhang
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Paper Abstract

We designed a measurement and control system which can measure the surface roughness parameters with a Single Chip Micyoco (SCM) as its kernel. It uses an inductive transducer to pick up the data. The instrumental structure and the working principle are also introduced in this paper. The integrated hardware and software systems have been designed and improved. The prototype model was calibrated and the instrumental precision was analysed according to the measured data. In this system the surface roughness parameters can automatically be measured and controlled, such as data processing, determination of the reference line, disposal of the surface profile informations, display and print of the results etc.

Paper Details

Date Published: 13 October 2006
PDF: 7 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62801Z (13 October 2006); doi: 10.1117/12.716176
Show Author Affiliations
Jinhong Han, Shandong Univ. of Technology (China)
Yunkai Wang, Shandong Univ. of Technology (China)
Xianfeng Zhang, Shandong Univ. of Technology (China)

Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

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