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Proceedings Paper

Characteristics of capacitance-micro-displacement for model of complex interior surface of the 3D Taiji ball and its applications
Author(s): Ruo-Gu Zhu; Kun Jiang; Zhao-Bo Qing; Yue-Hui Liu; Jun Yan
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Paper Abstract

Taiji image originated from ancient China. It is not only the Taoism emblem but also the ancient graphic presentation sign to everything origin. It either has a too far-reaching impact on traditional culture of China, or is influencing the development of current natural science. On the basis of analyzing the classical philosophic theory of two-dimensional (2-D) Taiji image, we developed it into the model of complex interior surface-three-dimensional (3-D) Taiji ball, and explored its possible applications. Combining modern mathematics and physics knowledge, we have studied on the physical meaning of 3-D Taiji ball, thus the plane change of original Taiji image is developed into space change which is more close to the real world. The change layers are obvious increased notably, and the amount of information included in this model increases correspondingly. We also realized a special paper 3-D Taiji ball whose surface is coved with metal foil by means of laser manufacture. A new experiment set-up for measuring micro displace has been designed and constituted thus the relation between capacitance and micro displacement for the 3-D Taiji ball has performed. Experimental and theoretical analyses are also finished. This models of 3-D Taiji ball for physical characteristics are the first time set up. Experimental data and fitting curves between capacitance and micro displacement for the special paper Taiji ball coved with metal foil are suggested. It is shown that the special Taiji ball has less leakage capacitance or more strengthen electric field than an ordinary half ball capacitance. Finally their potential applied values are explored.

Paper Details

Date Published: 25 October 2006
PDF: 6 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62800Y (25 October 2006); doi: 10.1117/12.716116
Show Author Affiliations
Ruo-Gu Zhu, China Institute of Metrology (China)
Kun Jiang, China Institute of Metrology (China)
Zhao-Bo Qing, China Institute of Metrology (China)
Yue-Hui Liu, China Institute of Metrology (China)
Jun Yan, China Institute of Metrology (China)

Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

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