
Proceedings Paper
Electrical impedance tomography of carbon nanotube composite materialsFormat | Member Price | Non-Member Price |
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Paper Abstract
The field of nanotechnology is rapidly maturing into a fertile and interdisciplinary research area from which new sensor
and actuator technologies can be conceived. The tools and processes derived from the nanotechnology field have
offered engineers the opportunity to design materials in which sensing transduction mechanisms can be intentionally
encoded. For example, single- and multi-walled carbon nanotubes embedded within polyelectrolyte thin films have been
proposed for strain and pH sensing. While the electromechanical and electrochemical response of carbon nanotube
composites can be experimentally characterized, there still lacks a fundamental understanding of how the conductivity of
carbon nanotube composites is spatially distributed and how it depends on external stimuli. In this study, electrical
impedance tomography is proposed for spatial characterization of the conductivity of carbon nanotube composite thin
films. The method proves promising for both assessment of as-fabricated thin film quality as well as for two-dimensional
sensing of thin film response to mechanical strain and exposure to pH environments.
Paper Details
Date Published: 10 April 2007
PDF: 10 pages
Proc. SPIE 6529, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007, 652926 (10 April 2007); doi: 10.1117/12.715663
Published in SPIE Proceedings Vol. 6529:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007
Masayoshi Tomizuka; Chung-Bang Yun; Victor Giurgiutiu, Editor(s)
PDF: 10 pages
Proc. SPIE 6529, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007, 652926 (10 April 2007); doi: 10.1117/12.715663
Show Author Affiliations
Jerome P. Lynch, Univ. of Michigan (United States)
Published in SPIE Proceedings Vol. 6529:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007
Masayoshi Tomizuka; Chung-Bang Yun; Victor Giurgiutiu, Editor(s)
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