
Proceedings Paper
Automated segmentation of alloy microstructures in serial section imagesFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper describes the application of the expectation-maximization/maximization of the posterior marginals
(EM/MPM) algorithm to serial section images, which inherently represent three dimensional (3D) data. The images of
interest are electron micrographs of cross sections of a titanium alloy. To improve the accuracy of the resulting
segmentation images, the images are pre-filtered before being used as input to the EM/MPM algorithm. The output of
the pre-filter at a particular pixel represents an estimate of the entropy at that pixel, based on the grayscale values of
neighboring pixels. This filter tends to be biased towards higher entropy values if an edge is present within the window
being used. This causes edges in the final segmentation to move out from higher entropy regions and into lower entropy
regions. In order to preserve the locations of these edges, a multiscale technique involving the use of an adaptive filter
window has been developed. We present experimental results demonstrating the application of this technique.
Paper Details
Date Published: 28 February 2007
PDF: 11 pages
Proc. SPIE 6498, Computational Imaging V, 64980E (28 February 2007); doi: 10.1117/12.715185
Published in SPIE Proceedings Vol. 6498:
Computational Imaging V
Charles A. Bouman; Eric L. Miller; Ilya Pollak, Editor(s)
PDF: 11 pages
Proc. SPIE 6498, Computational Imaging V, 64980E (28 February 2007); doi: 10.1117/12.715185
Show Author Affiliations
Joel M. Dumke, Purdue Univ. (United States)
Mary L. Comer, Purdue Univ. (United States)
Published in SPIE Proceedings Vol. 6498:
Computational Imaging V
Charles A. Bouman; Eric L. Miller; Ilya Pollak, Editor(s)
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