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Proceedings Paper

A thin FinFET Si-fin body structure fabricated with 193-nm scanner photolithography and composite hard mask etching technique upon bulk-Si substrate
Author(s): Wen-Shiang Liao; Yu-Huan Liu; Wen-Tung Chang; Tung-Hung Chen; Tommy Shih; Huan-Chiu Tsen; Lee Chung
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Paper Abstract

A thin FinFET bulk Si-fin body structure has been successfully fabricated upon bulk-Si wafers through using 193nm scanner lithography and a composite hard mask etching technique. First, a 100Å-thick buffer SiO2 layer was thermally grown upon the bulk silicon layer and subsequently a 1200Å-thick SiNx layer and a 1000Å-thick TEOS SiO2 hard mask layer was chemically vapor deposited to form a composite hard mask structure of buffer-SiO2/SiNx/TEOS. Second, both 1050Å-thick BARC and 2650Å-thick photoresist (P/R) were coated and a 193nm scanner lithography tool was used for the Si-fin body layout patterning under relatively high exposure energy. This achieves the ADI (after develop inspection) of 80nm from the original as-drawn Si-fin layout of 110nm. Then, a deep sub-micron plasma etcher was used for an aggressive P/R and BARC trimming down processing and both the capping TEOS and CVD-SiNx with its underlying buffer oxide layers were subsequently etched in other etching plasma chambers, respectively. Resultantly, the AMI (after mask inspection) can reach 60nm. Subsequently, both the P/R and BARC were removed with a nominal plasma ashing as well as a RCA cleaning for the final sub-micron Si-fin plasma etching. Eventually, a 60nm-width and 400nm-height bulk Si-fin body structure can be successfully etched out after a fixed time-mode silicon plasma etching.

Paper Details

Date Published: 27 March 2007
PDF: 5 pages
Proc. SPIE 6520, Optical Microlithography XX, 65204N (27 March 2007); doi: 10.1117/12.714391
Show Author Affiliations
Wen-Shiang Liao, United Microelectronics Corp. (Taiwan)
Yu-Huan Liu, United Microelectronics Corp. (Taiwan)
Wen-Tung Chang, United Microelectronics Corp. (Taiwan)
National Chia Tung Univ. (Taiwan)
Tung-Hung Chen, United Microelectronics Corp. (Taiwan)
Tommy Shih, United Microelectronics Corp. (Taiwan)
Huan-Chiu Tsen, United Microelectronics Corp. (Taiwan)
Lee Chung, United Microelectronics Corp. (Taiwan)

Published in SPIE Proceedings Vol. 6520:
Optical Microlithography XX
Donis G. Flagello, Editor(s)

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