Share Email Print

Proceedings Paper

Classification of yeast cells from image features to evaluate pathogen conditions
Author(s): Peter van der Putten; Laura Bertens; Jinshuo Liu; Ferry Hagen; Teun Boekhout; Fons J. Verbeek
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Morphometrics from images, image analysis, may reveal differences between classes of objects present in the images. We have performed an image-features-based classification for the pathogenic yeast Cryptococcus neoformans. Building and analyzing image collections from the yeast under different environmental or genetic conditions may help to diagnose a new "unseen" situation. Diagnosis here means that retrieval of the relevant information from the image collection is at hand each time a new "sample" is presented. The basidiomycetous yeast Cryptococcus neoformans can cause infections such as meningitis or pneumonia. The presence of an extra-cellular capsule is known to be related to virulence. This paper reports on the approach towards developing classifiers for detecting potentially more or less virulent cells in a sample, i.e. an image, by using a range of features derived from the shape or density distribution. The classifier can henceforth be used for automating screening and annotating existing image collections. In addition we will present our methods for creating samples, collecting images, image preprocessing, identifying "yeast cells" and creating feature extraction from the images. We compare various expertise based and fully automated methods of feature selection and benchmark a range of classification algorithms and illustrate successful application to this particular domain.

Paper Details

Date Published: 29 January 2007
PDF: 14 pages
Proc. SPIE 6506, Multimedia Content Access: Algorithms and Systems, 65060I (29 January 2007); doi: 10.1117/12.714072
Show Author Affiliations
Peter van der Putten, Leiden Univ. (Netherlands)
Laura Bertens, Leiden Univ. (Netherlands)
Jinshuo Liu, Leiden Univ. (Netherlands)
Ferry Hagen, Netherlands Royal Academy of Science (Netherlands)
Teun Boekhout, Netherlands Royal Academy of Science (Netherlands)
Fons J. Verbeek, Leiden Univ. (Netherlands)

Published in SPIE Proceedings Vol. 6506:
Multimedia Content Access: Algorithms and Systems
Alan Hanjalic; Raimondo Schettini; Nicu Sebe, Editor(s)

© SPIE. Terms of Use
Back to Top