
Proceedings Paper
Spectral analysis and information extraction of crop disease by multi-temporal hyperspectral imagesFormat | Member Price | Non-Member Price |
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Paper Abstract
Spectrum of healthy green vegetation shows idiographic features of "peak and valley", the spectral curve will vary when
crop's biochemical status changes (e.g. disease harmed). Normalized Difference Vegetation Index (NDVI) is an
important vegetation index and has been proved to be very useful to vegetation change detection, vegetation
classification and some parameters calculation. Based on the differences of spectra information and characteristics
between multi-temporal hyperspectral images, a new adjustable vegetation index, Multi-Temporal NDVI (MT-NDVI), is
provided in this paper. Comparing to the classification of Spectral Angle Mapper (SAM), mapping and analysis using
MT-NDVI data can be well utilized for monitoring and recognizing crop disease from multi-temporal airborne PHI
(Pushbroom Hyperspectral Imager) image data acquired at the same field. The applicable result shows that MT-NDVI is
suitable way to extract crop disease information and estimate disease degrees.
Paper Details
Date Published: 28 October 2006
PDF: 6 pages
Proc. SPIE 6419, Geoinformatics 2006: Remotely Sensed Data and Information, 641909 (28 October 2006); doi: 10.1117/12.712696
Published in SPIE Proceedings Vol. 6419:
Geoinformatics 2006: Remotely Sensed Data and Information
Liangpei Zhang; Xiaoling Chen, Editor(s)
PDF: 6 pages
Proc. SPIE 6419, Geoinformatics 2006: Remotely Sensed Data and Information, 641909 (28 October 2006); doi: 10.1117/12.712696
Show Author Affiliations
Ke-ming Yang, China Univ. of Mining and Technology (China)
Yun-hao Chen, Beijing Normal Univ. (China)
Yun-hao Chen, Beijing Normal Univ. (China)
Da-zhi Guo, China Univ. of Mining and Technology (China)
Jin-Bao Jiang, Beijing Normal Univ. (China)
Jin-Bao Jiang, Beijing Normal Univ. (China)
Published in SPIE Proceedings Vol. 6419:
Geoinformatics 2006: Remotely Sensed Data and Information
Liangpei Zhang; Xiaoling Chen, Editor(s)
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