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Proceedings Paper

Measurement of sugar content of watermelon using near-infrared reflectance spectroscopy in comparison with dielectric property
Author(s): Xuemei Tao; Yidan Bao
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Paper Abstract

The sugar content of watermelon is important to its taste thus influences the market. It's difficult to know whether the melon is sweet or not for consumers. We tried to develop a convenient meter to determine the sugar of watermelon. The first objective of this paper was to demonstrate the feasibility of using a near-infrared reflectance spectrometer (NIRS) to investigate the relationship between sugar content of watermelon and absorption spectra. The NIRS reflectance of nondestructive watermelon was measured with a Visible/NIR spectrophotometer in 325-1075nm range. The sugar content of watermelon was obtained with a handhold sugar content meter. The second objective was to measure the watermelon's dielectric property, such as dielectric resistance, capacitance, quality factor and dielectric loss. A digital electric bridge instrument was used to get the dielectric property. The experimental results show that they were related to watermelon's sugar content. A comparison between the two methods was made in the paper. The model derived from NIRS reflection is useful for class identification of Zaochun Hongyu watermelon though it's not quite accurate in sweetness prediction (the max. deviation is 0.7). Electric property bears little relation to sugar content of watermelon at this experiment and it couldn't be used as non-destructive inspection method.

Paper Details

Date Published: 27 October 2006
PDF: 7 pages
Proc. SPIE 6047, Fourth International Conference on Photonics and Imaging in Biology and Medicine, 60473V (27 October 2006); doi: 10.1117/12.710921
Show Author Affiliations
Xuemei Tao, Zhejiang Univ. (China)
Yidan Bao, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 6047:
Fourth International Conference on Photonics and Imaging in Biology and Medicine
Kexin Xu; Qingming Luo; Da Xing; Alexander V. Priezzhev; Valery V. Tuchin, Editor(s)

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