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Proceedings Paper

CatSim: a new computer assisted tomography simulation environment
Author(s): Bruno De Man; Samit Basu; Naveen Chandra; Bruce Dunham; Peter Edic; Maria Iatrou; Scott McOlash; Paavana Sainath; Charlie Shaughnessy; Brendon Tower; Eugene Williams
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Paper Abstract

We present a new simulation environment for X-ray computed tomography, called CatSim. CatSim provides a research platform for GE researchers and collaborators to explore new reconstruction algorithms, CT architectures, and X-ray source or detector technologies. The main requirements for this simulator are accurate physics modeling, low computation times, and geometrical flexibility. CatSim allows simulating complex analytic phantoms, such as the FORBILD phantoms, including boxes, ellipsoids, elliptical cylinders, cones, and cut planes. CatSim incorporates polychromaticity, realistic quantum and electronic noise models, finite focal spot size and shape, finite detector cell size, detector cross-talk, detector lag or afterglow, bowtie filtration, finite detector efficiency, non-linear partial volume, scatter (variance-reduced Monte Carlo), and absorbed dose. We present an overview of CatSim along with a number of validation experiments.

Paper Details

Date Published: 21 March 2007
PDF: 8 pages
Proc. SPIE 6510, Medical Imaging 2007: Physics of Medical Imaging, 65102G (21 March 2007); doi: 10.1117/12.710713
Show Author Affiliations
Bruno De Man, GE Global Research (United States)
Samit Basu, GE Global Research (United States)
Naveen Chandra, GE Healthcare (United States)
Bruce Dunham, GE Healthcare (United States)
Peter Edic, GE Global Research (United States)
Maria Iatrou, GE Global Research (United States)
Scott McOlash, GE Healthcare (United States)
Paavana Sainath, GE Healthcare (United States)
Charlie Shaughnessy, GE Healthcare (United States)
Brendon Tower, GE Global Research (United States)
Eugene Williams, GE Healthcare (United States)

Published in SPIE Proceedings Vol. 6510:
Medical Imaging 2007: Physics of Medical Imaging
Jiang Hsieh; Michael J. Flynn, Editor(s)

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