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Proceedings Paper

A wafer scale active pixel CMOS image sensor for generic x-ray radiology
Author(s): Danny Scheffer
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Paper Abstract

This paper describes a CMOS Active Pixel Image Sensor developed for generic X-ray imaging systems using standard CMOS technology and an active pixel architecture featuring low noise and a high sensitivity. The image sensor has been manufactured in a standard 0.35 μm technology using 8" wafers. The resolution of the sensor is 3360x3348 pixels of 40x40 μm2 each. The diagonal of the sensor measures little over 190 mm. The paper discusses the floor planning, stitching diagram, and the electro-optical performance of the sensor that has been developed.

Paper Details

Date Published: 16 March 2007
PDF: 9 pages
Proc. SPIE 6510, Medical Imaging 2007: Physics of Medical Imaging, 65100O (16 March 2007); doi: 10.1117/12.708433
Show Author Affiliations
Danny Scheffer, Cypress Semiconductor Belgium (Belgium)


Published in SPIE Proceedings Vol. 6510:
Medical Imaging 2007: Physics of Medical Imaging
Jiang Hsieh; Michael J. Flynn, Editor(s)

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