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Proceedings Paper

Ellipsometry of speckle patterns for the analysis of optical inhomogeneities (surfaces and bulks)
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Paper Abstract

Far field light scattering from rough surfaces and inhomogeneous bulks has extensively been studied these last decades, with a major application in random media characterization. Angular Resolved measurements are performed and investigated thanks to the development of electromagnetic models. The studies are extended to the case of high angular resolution, that's mean to the speckle pattern. We show that the analysis of the polarization state of the scattered field permits to complete this study and to identify signatures of the different polarization sources which are surfaces or bulks. An application will then be to annul each scattering source in order to select the characterized element.

Paper Details

Date Published: 15 September 2006
PDF: 6 pages
Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63412V (15 September 2006); doi: 10.1117/12.695993
Show Author Affiliations
Gaëlle Georges, Institut Fresnel, CNRS (France)
Laurent Arnaud, Institut Fresnel, CNRS (France)
Carole Deumié, Institut Fresnel, CNRS (France)
Claude Amra, Institut Fresnel, CNRS (France)

Published in SPIE Proceedings Vol. 6341:
Speckle06: Speckles, From Grains to Flowers
Pierre Slangen; Christine Cerruti, Editor(s)

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