Proceedings Paper
Measurement of mechanically induced luminescence from microparticles| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
We developed an AFM-based new apparatus with a photomultiplier in order to measure the weak light emission
from a single microparticle induced by applying a micro force and measured the emission intensity as a function of the
applied micro force and speed. The emission intensity was approximately proportional to the speed of the applied micro-
force and the square of the micro stress.
Paper Details
Date Published: 22 December 2006
PDF: 4 pages
Proc. SPIE 6413, Smart Materials IV, 64130O (22 December 2006);
Published in SPIE Proceedings Vol. 6413:
Smart Materials IV
Nicolas H. Voelcker, Editor(s)
PDF: 4 pages
Proc. SPIE 6413, Smart Materials IV, 64130O (22 December 2006);
Show Author Affiliations
T. Koga, National Institute of Advanced Industrial Science and Technology (Japan)
K. Sakai, National Institute of Advanced Industrial Science and Technology (Japan)
S. Maehara, National Institute of Advanced Industrial Science and Technology (Japan)
K. Sakai, National Institute of Advanced Industrial Science and Technology (Japan)
S. Maehara, National Institute of Advanced Industrial Science and Technology (Japan)
N. Terasaki, National Institute of Advanced Industrial Science and Technology (Japan)
Y. Imai, National Institute of Advanced Industrial Science and Technology (Japan)
C. N. Xu, National Institute of Advanced Industrial Science and Technology (Japan)
Y. Imai, National Institute of Advanced Industrial Science and Technology (Japan)
C. N. Xu, National Institute of Advanced Industrial Science and Technology (Japan)
Published in SPIE Proceedings Vol. 6413:
Smart Materials IV
Nicolas H. Voelcker, Editor(s)
© SPIE. Terms of Use
