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Proceedings Paper

Depth-resolved displacement measurement using tilt scanning speckle interferometry
Author(s): Jonathan M. Huntley; Pablo D. Ruiz
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Paper Abstract

We describe a novel technique that we call Tilt Scanning Interferometry (TSI) to measure depth-resolved structure and displacement fields within semitransparent scattering materials. The method differs significantly from conventional optical coherence tomography in that only one wavelength is used throughout the whole measurement process. Temporal sequences of speckle interferograms are recorded whilst the illumination angle is tilted at a constant rate. Fourier transformation of the resulting three-dimensional (3-D) intensity distribution along the time axis reconstructs the scattering potential within the medium. Repeating the measurements with the object wave at equal and opposite angles about the observation direction results in two 3-D phase-change volumes, the sum of which gives the out-of-plane-sensitive phase volume and the difference between which gives the in-plane phase volume. From these phase-change volumes the in-plane and out-of-plane depth-resolved displacement fields are obtained. The theoretical framework for the technique is outlined and results from proof-of-principle experiments involving a semitransparent beam undergoing bending are presented.

Paper Details

Date Published: 15 September 2006
PDF: 5 pages
Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 634116 (15 September 2006); doi: 10.1117/12.695356
Show Author Affiliations
Jonathan M. Huntley, Loughborough Univ. (United Kingdom)
Pablo D. Ruiz, Loughborough Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 6341:
Speckle06: Speckles, From Grains to Flowers
Pierre Slangen; Christine Cerruti, Editor(s)

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