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Proceedings Paper

Single-shot depth-resolved displacement field measurement using phase-contrast polychromatic speckle interferometry
Author(s): Pablo D. Ruiz; Manuel de la Torre-Ibarra; Jonathan M. Huntley
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Paper Abstract

We describe a system for measuring sub-surface displacement fields within a scattering medium using a broadband super-luminescent light emitting diode (SLED) source and spectral imaging. The use of phase information in the backscattered speckle pattern offers displacement sensitivity in the range of a few tens of nm, some two to three orders of magnitude better than the depth resolution of state-of-the-art Optical Coherence Tomography systems. The system is based on low cost components and has no moving parts. It provides displacement maps within a 2-D slice extending into the sample, and the fact that all the data for a given deformation state are acquired in a single shot is a highly attractive feature for in-vivo investigations in the biological sciences. The theoretical basis for the system is presented along with experimental results from a simple well-controlled geometry consisting of independently-tilting glass sheets. Results are validated using standard two-beam interferometry. Scattering samples were also studied and we show a wrapped phase map through the thickness of a pig ex-vivo cornea. The phase change was due to viscoelastic creep in the cornea after a change in the intraocular pressure.

Paper Details

Date Published: 15 September 2006
PDF: 7 pages
Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63410U (15 September 2006); doi: 10.1117/12.695305
Show Author Affiliations
Pablo D. Ruiz, Loughborough Univ. (United Kingdom)
Manuel de la Torre-Ibarra, Ctr. de Investigaciones en Óptica Asociación Civil (Mexico)
Jonathan M. Huntley, Loughborough Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 6341:
Speckle06: Speckles, From Grains to Flowers
Pierre Slangen; Christine Cerruti, Editor(s)

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