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Proceedings Paper

QWIP from 4µm up to 18µm
Author(s): Eric Costard; Jean P. Truffer; Odile Huet; Lydie Dua; Alexandre Nedelcu; J. A. Robo; Xavier Marcadet; Nadia Brèire de l'Isle; Philippe Bois
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Paper Abstract

Standard GaAs/AlGaAs Quantum Well Infrared Photodetectors (QWIP) are considered as a technological choice for 3rdgeneration thermal imagers [1], [2]. Since 2001, the THALES Group has been manufacturing sensitive arrays using AsGa based QWIP technology at THALES Research and Technology Laboratory. This QWIP technology allows the realization of large staring arrays for Thermal Imagers (TI) working in the Infrared region of the spectrum. The main advantage of this GaAs detector technology is that it is also used for other commercial devices. The GaAs industry has lead to important improvements over the last ten years and it reaches now an undeniable level of maturity. As a result the key parameters to reach high production yield: large substrate and good uniformity characteristics, have already been achieved. Considering defective pixels, the main usual features are a high operability (> 99.9%) and a low number of clusters having a maximum of 4 dead pixels. Another advantage of this III-V technology is the versatility of the design and processing phases. It allows customizing both the quantum structure and the pixel architecture in order to fulfill the requirements of any specific applications. The spectral response of QWIPs is intrinsically resonant but the quantum structure can be designed for a given detection wavelength window ranging from MWIR, LWIR to VLWIR.

Paper Details

Date Published: 3 October 2006
PDF: 12 pages
Proc. SPIE 6361, Sensors, Systems, and Next-Generation Satellites X, 636117 (3 October 2006);
Show Author Affiliations
Eric Costard, Thales Research & Technology (France)
Jean P. Truffer, Thales Research & Technology (France)
Odile Huet, Thales Research & Technology (France)
Lydie Dua, Thales Research & Technology (France)
Alexandre Nedelcu, Thales Research & Technology (France)
J. A. Robo, Thales Research & Technology (France)
Xavier Marcadet, Thales Research & Technology (France)
Nadia Brèire de l'Isle, Thales Research & Technology (France)
Philippe Bois, Thales Research & Technology (France)

Published in SPIE Proceedings Vol. 6361:
Sensors, Systems, and Next-Generation Satellites X
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda, Editor(s)

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