
Proceedings Paper
Interaction between parameters of 320x240 pixels uncooled microbolometer focal plane array detectorFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, on the base of simple introduction of inner structure of 320×240 pixels UFPA in electronics and
calorifics, the relationship of NETD (noise equivalent temperature difference) and bias voltage are researched and
presented through the formulas about noise and NETD. The relation between NETD and four kinds of temperatures is
presented. Moreover the two bias voltages are adjusted to observe the changing of NETD. Some experiments on power
consumption and image quality of thermal imaging system is done, the result data is given. On the basis of the theory and
experiments, how to enhance the NETD performance of UFPA (Focal Plane Array) at much lower or higher than room
temperature is researched by analyzing experiment data. At last, the conclusion is summarized: in order to get the best
image and the lest power consumption, we should adjust these parameters to find the optimized configuration at different
application conditions.
Paper Details
Date Published: 6 October 2006
PDF: 9 pages
Proc. SPIE 6352, Optoelectronic Materials and Devices, 63523G (6 October 2006); doi: 10.1117/12.688651
Published in SPIE Proceedings Vol. 6352:
Optoelectronic Materials and Devices
Yong Hee Lee; Fumio Koyama; Yi Luo, Editor(s)
PDF: 9 pages
Proc. SPIE 6352, Optoelectronic Materials and Devices, 63523G (6 October 2006); doi: 10.1117/12.688651
Show Author Affiliations
Shiyun Wang, Nanjing Univ. of Science and Technology (China)
Jijun Zou, Nanjing Univ. of Science and Technology (China)
Lianjun Sun, Nanjing Univ. of Science and Technology (China)
Jijun Zou, Nanjing Univ. of Science and Technology (China)
Lianjun Sun, Nanjing Univ. of Science and Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)
Junju Zhang, Nanjing Univ. of Science and Technology (China)
Junju Zhang, Nanjing Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 6352:
Optoelectronic Materials and Devices
Yong Hee Lee; Fumio Koyama; Yi Luo, Editor(s)
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