In this paper, on the base of simple introduction of inner structure of 320×240 pixels UFPA in electronics and calorifics, the relationship of NETD (noise equivalent temperature difference) and bias voltage are researched and presented through the formulas about noise and NETD. The relation between NETD and four kinds of temperatures is presented. Moreover the two bias voltages are adjusted to observe the changing of NETD. Some experiments on power consumption and image quality of thermal imaging system is done, the result data is given. On the basis of the theory and experiments, how to enhance the NETD performance of UFPA (Focal Plane Array) at much lower or higher than room temperature is researched by analyzing experiment data. At last, the conclusion is summarized: in order to get the best image and the lest power consumption, we should adjust these parameters to find the optimized configuration at different application conditions.

Date Published: 6 October 2006
PDF: 9 pages
Proc. SPIE 6352, Optoelectronic Materials and Devices, 63523G (6 October 2006); doi: 10.1117/12.688651

Published in SPIE Proceedings Vol. 6352:
Optoelectronic Materials and Devices
Yong Hee Lee; Fumio Koyama; Yi Luo, Editor(s)