Share Email Print

Proceedings Paper

Film stress studies and the multilayer Laue lens project
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A Multilayer Laue Lens (MLL) is a new type of linear zone plate, made by sectioning a planar depth-graded multilayer and used in Laue transmission diffraction geometry, for nanometer-scale focusing of hard x-rays. To produce an MLL, a depth-graded multilayer consisting of thousands of layers with a total thickness of tens of microns is needed. Additionally, the multilayer wafer has to be sectioned and polished to a thickness of ~10 to 25 microns to yield a diffracting grating to focus x-rays. The multilayers must have both low stress and good adhesion to survive the subsequent cutting and polishing processes, as well as sharp interfaces and accurate layer placement. Several partial MLLs using WSi2/Si multilayers with precise zone-plate structures have been successfully fabricated. A W/Si multilayer with the same structure, however, cracked and peeled off from the Si substrate after it was grown. Here we report results of our film stress studies of dc magnetron-sputtered WSi2, W, and Mo thin films and WSi2/Si, W/Si, and Mo/Si multilayers grown on Si(100) substrates. The stress measurements were carried out using a stylus profiler to measure the curvatures of 2-inch-diameter, 0.5-mm-thick Si(100) wafers before and after each coating. The physical origins of the stress and material properties of these systems will be discussed.

Paper Details

Date Published: 29 August 2006
PDF: 9 pages
Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 63170J (29 August 2006); doi: 10.1117/12.687074
Show Author Affiliations
Chian Liu, Argonne National Lab. (United States)
R. Conley, Argonne National Lab. (United States)
A. T. Macrander, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 6317:
Advances in X-Ray/EUV Optics, Components, and Applications
Ali M. Khounsary; Christian Morawe, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?