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Proceedings Paper

Additional algorithms for sensor chip alignment to blind datums
Author(s): Gary B. Hughes
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Paper Abstract

Alignment of the sensor focal plane array (FPA) to optical components is a critical design feature. Imaging system designs include reference datums that provide the basis for manufacturing alignment in each sub-assembly. Measurement of z and parallelism positioning can be problematic, since the relevant datum features are often beneath the mounting platform and are obscured to the measurement system. General algorithms for determining sensor chip alignment when datum features are inaccessible to the measurement system have been developed. Pre-characterization measurements of datum surfaces are stored for later use during alignment measurement to determine datum locations. The algorithms are useful for post-mounting alignment measurement, and can also be used for active manufacturing alignment. This paper presents additional algorithms that are useful for active alignment, including methods for determining rotation axes on the aligner-bonder system and for determining actuator motions to bring the FPA into alignment with datums. The algorithms have been successfully implemented for ultra-precision, active manufacturing alignment and post-alignment measurement of infrared imaging systems.

Paper Details

Date Published: 5 September 2006
PDF: 13 pages
Proc. SPIE 6289, Novel Optical Systems Design and Optimization IX, 62890K (5 September 2006); doi: 10.1117/12.683300
Show Author Affiliations
Gary B. Hughes, FLIR Systems Inc. (United States)

Published in SPIE Proceedings Vol. 6289:
Novel Optical Systems Design and Optimization IX
José M. Sasian; Mary G. Turner, Editor(s)

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