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Proceedings Paper

Radiometric calibration and mission simulation testing of sensor systems in the AEDC 7V and 10V chambers
Author(s): R. A. Nicholson; K. D. Mead; H. S. Lowry
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Paper Abstract

The Arnold Engineering Development Center (AEDC) has performed characterization and calibration of space-based, airborne, and interceptor sensor systems for over 35 years. The 7V and 10V Chambers provide a suite of IR and visible target systems that operate in a simulated space background (< 20K) and allow complete evaluation of sensor performance within a single test installation. Test facility upgrades are continuously pursued to keep pace with evolving sensor technologies. This paper describes the methodology used to perform calibration and characterization of sensor systems in the AEDC 7V and 10V test chambers. Complex target systems that provide the ability to evaluate system performance against representative mission scenarios are included in both test chambers. Representative results associated with the calibration and mission simulation capabilities are shown. The overall status of the 7V and 10V Chamber facilities is described, and plans to implement improved calibration capabilities are discussed. Results from analysis performed on data collected during checkout testing of source systems included in both sensor test chambers are presented. The results illustrate the ability of the 7V and 10V Chambers to facilitate complete characterization of sensor performance with a high degree of accuracy in a representative mission operating environment.

Paper Details

Date Published: 16 May 2006
PDF: 13 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080D (16 May 2006); doi: 10.1117/12.681224
Show Author Affiliations
R. A. Nicholson, Aerospace Testing Alliance (United States)
K. D. Mead, Aerospace Testing Alliance (United States)
H. S. Lowry, Aerospace Testing Alliance (United States)

Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer Jr., Editor(s)

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