Proceedings Paper
Theoretical analysis and experimental study on processing electronic speckle pattern using once phase-shifting method| Format | Member Price | Non-Member Price |
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Paper Abstract
One-time phase shifting method, by which a high-quality correlation fringe image has been obtained, is presented in this paper. By comparison with the image quality obtained in traditional ways through simulation on a computer, there is no essential difference between images obtained by this method and twice or three times π/2 phase shifting methods. Subsequently, the image obtained from experiments of digital shearography is processed. Experiment result proves that the method is feasible.
Paper Details
Date Published: 23 February 2006
PDF: 7 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61502P (23 February 2006); doi: 10.1117/12.676939
Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)
PDF: 7 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61502P (23 February 2006); doi: 10.1117/12.676939
Show Author Affiliations
Junchang Li, Kunming Univ. of Science and Technology (China)
Qinghe Song, Kunming Univ. of Science and Technology (China)
Jie Zhu, Kunming Univ. of Science and Technology (China)
Qinghe Song, Kunming Univ. of Science and Technology (China)
Jie Zhu, Kunming Univ. of Science and Technology (China)
Chongguang Li, Kunming Univ. of Science and Technology (China)
Zebin Fan, Kunming Univ. of Science and Technology (China)
Zebin Fan, Kunming Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)
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