
Proceedings Paper
Digital speckle displacement measurement by fuzzy logic correlationFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Fuzzy set has an advantage over classic set for representation of objects with a high degree of vagueness, inaccurate, or uncertainty. Fuzzy set theory could be seen as a generalization of classic set theory. In this paper, a digital speckle correlation method based on fuzzy logic (DSCMF) is proposed to measure the displacement of laser speckles. DSCMF is developed to improve performances of the digital speckle correlation method based on classic logic (DSCMC), at the same time keeping low computation simplicity. Fuzzy correlation between two images could be defined as an integral of membership of similarity between elements of two images. Membership function of similarity is defined to represent the distance of two values. An optical and analysis system was set up to verify DSCMF's validity. A parameter δSN is introduced to represent the ratio of signal to noise. Experimental results show that DSCMF using triangle tent similarity membership function could obtain a bigger tδSN than DSCMC could. This paper also shows the influence on δSN of quantification of membership function.
Paper Details
Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61505A (23 February 2006); doi: 10.1117/12.676937
Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61505A (23 February 2006); doi: 10.1117/12.676937
Show Author Affiliations
Dong Hui Li, Univ. of Science and Technology of China (China)
Li Guo, Univ. of Science and Technology of China (China)
Li Guo, Univ. of Science and Technology of China (China)
Tian Qiu, Univ. of Science and Technology of China (China)
Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)
© SPIE. Terms of Use
