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Proceedings Paper

µ-XRFA and µ-EXAFS measurements of organic and non-organic samples: status report
Author(s): Alexei Erko
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Paper Abstract

The capabilities of the KMC-2 beamline at BESSY for spatially resolved x-ray measurements with micro- and nanometer resolution are reviewed. An application of micro- X-ray fluorescence analysis (μXRFA), micro-extended X-ray absorption fine structure (μEXAFS), micro-X-ray absorption near-edge structure (μXANES) as well as standing wave technique (SWT) as a powerful method for the organic and non-organic samples characterization with synchrotron radiation is discussed. Mono and poly-capillary optical systems were used for characterization of organic and non-organic samples, by means of μXRFA mapping and μEXAFS and μXANES. The results of depth resolved tungsten XAFS measurements in a Si/W/Si trilayer embedded in a Au waveguide structure are presented. A depth resolution on the order of 1nm has been achieved.

Paper Details

Date Published: 14 September 2006
PDF: 10 pages
Proc. SPIE 6309, Instruments, Methods, and Missions for Astrobiology IX, 63090W (14 September 2006); doi: 10.1117/12.675625
Show Author Affiliations
Alexei Erko, BESSY GmbH (Germany)


Published in SPIE Proceedings Vol. 6309:
Instruments, Methods, and Missions for Astrobiology IX
Richard B. Hoover; Gilbert V. Levin; Alexei Y. Rozanov, Editor(s)

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