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Proceedings Paper

Experimental study of front and back ablation of metal thin film using ultrashort laser pulses
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Paper Abstract

In order to control the technique of laser-induced forward transfer (LIFT) in ultrashort regimes, it is necessary to understand the different basic mechanisms involved during the three steps: ablation-transfer-deposition. Back ablation of Cr thin film has been studied and compared to the front ablation of the same film in the same conditions. Experiments have been performed using ultrashort laser pulses (800 nm, 100 fs). The dynamics of the plumes have been monitored with a gated intensified charge coupled device (ICCD) camera. Image analysis gave us indications on the velocity and the composition of the ejected material. A parametric study of the ablation thresholds and ablation dynamics has been carried out as a function of the incident laser fluence and the thickness of the metal layer. These results contribute to optimize a process of LIFT. Transfers of Cr on glass and Silicon were obtained with a good spatial resolution.

Paper Details

Date Published: 7 June 2006
PDF: 7 pages
Proc. SPIE 6261, High-Power Laser Ablation VI, 626127 (7 June 2006); doi: 10.1117/12.674683
Show Author Affiliations
Anne-Patricia Alloncle, Lab. Laser Plasma et Procédés Photoniques (France)
Renaud Bouffaron, Lab. Laser Plasma et Procédés Photoniques (France)
Jörg Hermann, Lab. Laser Plasma et Procédés Photoniques (France)
Marc Sentis, Lab. Laser Plasma et Procédés Photoniques (France)

Published in SPIE Proceedings Vol. 6261:
High-Power Laser Ablation VI
Claude R. Phipps, Editor(s)

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