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Proceedings Paper

Measurement of spatial filtering capabilities of single mode infrared fibers
Author(s): A. Ksendzov; E. Bloemhof; V. White; J. K. Wallace; R. O. Gappinger; J. S. Sanghera; L. E. Busse; W. J. Kim; P. C. Pureza; V. Q. Nguyen; I. D. Aggarwal; S. Shalem; A. Katzir
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Paper Abstract

Spatial filtering is necessary to achieve deep nulls in optical interferometer and single mode infrared fibers can serve as spatial filters. The filtering function is based on the ability of these devices to perform the mode-cleaning function: only the component of the input field that is coupled to the single bound (fundamental) mode of the device propagates to the output without substantial loss. In practical fiber devices, there are leakage channels that cause light not coupled into the fundamental mode to propagate to the output. These include propagation through the fiber cladding and by means of a leaky mode. We propose a technique for measuring the magnitude of this leakage and apply it to infrared fibers made at the Naval Research Laboratory and at Tel Aviv University. All measurements are performed at 10.5 μm wavelength.

Paper Details

Date Published: 28 June 2006
PDF: 6 pages
Proc. SPIE 6268, Advances in Stellar Interferometry, 626838 (28 June 2006); doi: 10.1117/12.673388
Show Author Affiliations
A. Ksendzov, Jet Propulsion Lab. (United States)
E. Bloemhof, Jet Propulsion Lab. (United States)
V. White, Jet Propulsion Lab. (United States)
J. K. Wallace, Jet Propulsion Lab. (United States)
R. O. Gappinger, Jet Propulsion Lab. (United States)
J. S. Sanghera, Naval Research Lab. (United States)
L. E. Busse, Naval Research Lab. (United States)
W. J. Kim, Naval Research Lab. (United States)
P. C. Pureza, Naval Research Lab. (United States)
V. Q. Nguyen, Naval Research Lab. (United States)
I. D. Aggarwal, Naval Research Lab. (United States)
S. Shalem, Tel Aviv Univ. (Israel)
A. Katzir, Tel Aviv Univ. (Israel)

Published in SPIE Proceedings Vol. 6268:
Advances in Stellar Interferometry
John D. Monnier; Markus Schöller; William C. Danchi, Editor(s)

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