Share Email Print

Proceedings Paper

Performance of large chemically etched silicon grisms for infrared spectroscopy
Author(s): D. J. Mar; J. P. Marsh; D. T. Jaffe; L. D. Keller; K. A. Ennico
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

FORCAST is a mid/far-IR camera for use on NASA's SOFIA airborne observatory. We are fabricating monolithic silicon grisms to retrofit a spectroscopic capability for this facility-class instrument without affecting the imaging optics. The grisms will operate in the 5-8, 17-28, and 28-37 μm wavelength ranges. We will cover the 5-8 μm range in one exposure at a resolving power R=1200 with a 2 arcsecond slit using two grisms with one serving as a cross-disperser. For the 17-28 and 28-37 μm ranges, the resolving powers are R~140, 250 when used in low order with a slit of 3 arcseconds. We illustrate aspects of fabrication and testing during the grism development, and summarize the performance of the gratings at near- and mid-IR wavelengths. These gratings rely on procedures that can be used for modest sized (~10 cm) silicon pieces, thereby providing dispersive elements with good optical performance and large slit width-resolving power products from 1.2-8.1 μm and beyond 17 μm.

Paper Details

Date Published: 27 June 2006
PDF: 10 pages
Proc. SPIE 6269, Ground-based and Airborne Instrumentation for Astronomy, 62695R (27 June 2006); doi: 10.1117/12.671728
Show Author Affiliations
D. J. Mar, Univ. of Texas at Austin (United States)
J. P. Marsh, Univ. of Texas at Austin (United States)
D. T. Jaffe, Univ. of Texas at Austin (United States)
L. D. Keller, Ithaca College (United States)
K. A. Ennico, NASA-Ames Research Ctr. (United States)

Published in SPIE Proceedings Vol. 6269:
Ground-based and Airborne Instrumentation for Astronomy
Ian S. McLean; Masanori Iye, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?